59,121 research outputs found
Save the "THRU" in the A.N.A. calibration
No full textThe conventional network analyzer (NWA) two-port calibration procedures require a standard thru line to be connected between the ports. Unfortunately in many applications, for example when measuring MMIC or on-wafer devices with not aligned ports, a custom thru line must be used. The procedure here applied overcomes the difficulty due to the poor knowledge of this thru element since it is based on a generic reciprocal unknown two port structure, provided that its S21 phase shift is roughly known. Some experimental comparisons with other well sound calibration techniques will be here presented where different reciprocal two-port structures were used as unknown thr
Novel hardware and software solutions for a complete linear and non-linear microwave device characterization
No full textTesting devices under different source impedances: a novel technique for on-line measurement of source and device reflection coefficients
No full textThis paper describes a new approach for fast and accurate determination of the source reflection coefficient in microwave source-pull measurements. To the authors' knowledge, this is the only technique that allows the simultaneous measurement of the source and the DUT gammas. A traditional vector network analyzer is used as a three-channel receiver. The calibration procedure is based on a new reflectometer model that extends the traditional error box concept. Experimental results are presented and compared to data obtained with traditional techniques
Large signal 2nd harmonic on wafer MESFET characterization
No full textAn automatic test set which performs a real time harmonic load-pull characterization is proposed. An active load technique is used in order to set the load at the test frequency and its harmonics and a complete set of device parameters useful for power amplifier design purposes can be measured versus the harmonic loads. The calibration procedure, based on substrate and coaxial standards, has been mainly developed for on wafer measurement in order to set the reference planes directly on the DU
Three port network analyzer: an original implementation with a simplified calibration procedure
No full textAccuracy of a multiport network analyzer
No full textThe accuracy of a multiport vector network analyzer, which uses a new calibration concept, has been compared with a 2-port network analyzer that implements the classical TRL procedure. The accuracy assessment is based on the analysis of the error propagation due to the connectors repeatability, both of the used standards and the measurands. The comparison, performed in the 2-18 GHz band on devices fitted with APC-7 mm connectors, proved the high accuracy reached by a multiport system which can qualify for metrological applications
Time domain reflectometry applied to MMIC passive component modeling
No full textThe time domain facilities of a network analyzer, combined with the tools of network synthesis, were recently used for experimental modeling of discontinuities in an S-parameter measurement set, so as to allow the instrument calibration directly to the ports of the device under test. The technique proved to be very useful in those cases where the discontinuities, that lie before the unknown device, cannot be isolated by the usual calibration methods, and therefore, since network synthesis deals only with frequency domain information, it is impossible to optimize the model's parameters, since they are affected by errors due to discontinuities. This paper describes a procedure which allows to isolate the response of the device under test, and to derive its complete model; when it to reach a reasonable accuracy it gives anyway a topology, which is a good starting point for other optimization routines that can be used for obtaining a better match, on a broad frequency band. This can be accomplished by optimzing the first approach topology to which other circuit elements have been added, so as to take into account second order effects especially at the higher frequencies. The technique was applied to model and characterize passive discrete components used in MMIC. The experimental results show the validity of the approac
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