1,721,251 research outputs found

    Enciclopedia UTET NOVA

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    Dal 1998 al 2001 responsabile della revisione delle voci di elettronica, elettrotecnica e unità di misura della nuova edizione del Grande Dizionario Enciclopedico “NOVA” pubblicato nel 2002. Ha revisionato 160 lemmi di cui ne ha firmati 24

    A homodyne Michelson interferometer with sub-picometer resolution

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    A homodyne interferometer which exploits a multiple reflection arrangement between two quasi parallel mirrors to deliver a multiplication factor is presented. The relative displacement of the two mirrors causes a more than 100-fold increment of the optical path, which is measured by the optoelectronic circuitry. This leads to a proportional reduction of the errors associated with the subdivision of the optical fringes, with the effect of fringe nonlinearities, and with the opto-electronic noise. In particular the reduction of the electronic noise limit to the level of 20 fm Hz^(−1/2) has been demonstrated. The exact formula of the gain has been calculated and confirmed experimentally

    Multiple reflection Michelson interferometer with picometer resolution

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    A Michelson interferometer based on an optical set-up allowing multiple reflection between two plane mirrors performs the multiplication of the optical path by a factor N, proportionally increasing the resolution of the measurement. A multiplication factor of almost two orders of magnitude has been demonstrated with a simple set-up. The technique can be applied to any interferometric measurement where the classical interferometer limits due to fringe nonlinearities and quantum noise are an issue. Applications in precision engineering, vibration analysis, nanometrology, and spectroscopy are foreseen

    Nano-angle generator for the calibration of angle measurement devices at the nanoradian level

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    An isnstrument capable of generating small rotations with a resolution better than 1 nrad is described. The instrument is used for the calibration of state-of-the-art angle measurement instruments (e.g. levels and autocollimators) and for international key comparisons

    Prism refractive index measurement at INRiM

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    A simple method to measure the refractive index of a glass prism with very low uncertainty was developed at INRiM. The method is a modification of the classical minimum deviation method. A brief description of the methods used to measure the vertex angles of the prism and the angle of minimum deviation is reported together with the uncertainty evaluation. The technique is going to be validated by a comparison between INRiM and two other laboratories. A relative standard uncertainty better than 1 ppm has been obtained
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