179 research outputs found
Hole-free phase plate energy filtering imaging of graphene: toward quantitative hole-free phase plate imaging in a TEM
No full textPeer reviewed: YesNRC publication: Ye
Sample preparation method for 3D size measurements of polystyrene nanoparticles with nominal 30, 50, 70 and 100 nm diameters by electron tomography
No full textUranyl nitrate-induced glomerular-basement-membrane alterations in rabbits: a quantitative-analysis
No full textPT: J; CR: AVASTHI PS, 1980, J CLIN INVEST, V65, P121 BLANTZ RC, 1985, KIDNEY INT, V28, P733 FOULKES EC, 1971, TOXICOL APPL PHARM, V20, P380 HAYASHIDA M, 1986, EXP GERONTOL, V21, P535 KANWAR YS, 1979, J CELL BIOL, V81, P137 KOBAYASHI S, 1984, KIDNEY INT, V26, P808 LATOUCHE YD, 1987, HEALTH PHYS, V53, P147 OSTERBY R, 1971, LAB INVEST, V25, P15 OSTRBY R, 1975, ACTA MED SCAND S, V574, P1 SEILER MW, 1975, SCIENCE, V189, P390 SINGH A, 1981, PATHOLOGY, V13, P487 SINGH A, 1985, ANN M AM ASS ADV SCI STEFFES MW, 1983, LAB INVEST, V49, P82 STEIN JH, 1975, KIDNEY INT, V8, P27 WEHNER H, 1973, DIABETOLOGIA, V9, P255; NR: 15; TC: 4; J9: BULL ENVIRON CONTAM TOXICOL; PG: 7; GA: HC562Source type: Electronic(1
Phase plates in the transmission electron microscope: operating principles and applications
No full textIn this paper, we review the current state of phase plate imaging in a transmission electron microscope. We focus especially on the hole-free phase plate design, also referred to as the Volta phase plate. We discuss the implementation, operating principles and applications of phase plate imaging. We provide an imaging theory that accounts for inelastic scattering in both the sample and in the hole-free phase plate
Temperature measurement in a tem using electron diffraction of amorphous films
No full textPeer reviewed: YesNRC publication: Ye
Thermal expansion coefficient measurement from electron diffraction of amorphous films in a TEM
No full textWe measured the linear thermal expansion coefficients of amorphous 5\u201330\u202fnm thick SiN and 17\u202fnm thick Formvar/Carbon (F/C) films using electron diffraction in a transmission electron microscope. Positive thermal expansion coefficient (TEC) was observed in SiN but negative coefficients in the F/C films. In case of amorphous carbon (aC) films, we could not measure TEC because the diffraction radii required several hours to stabilize at a fixed temperature.Peer reviewed: YesNRC publication: Ye
Computer simulations analysis for determining the polarity of charge generated by high energy electron irradiation of a thin film
No full textDetailed simulations are necessary to correctly interpret the charge polarity of electron beam irradiated thin film patch. Relying on systematic simulations we provide guidelines and movies to interpret experimentally the polarity of the charged area, to be understood as the sign of the electrostatic potential developed under the beam with reference to a ground electrode. We discuss the two methods most frequently used to assess charge polarity: Fresnel imaging of the irradiated area and Thon rings analysis. We also briefly discuss parameter optimization for hole free phase plate (HFPP) imaging. Our results are particularly relevant to understanding contrast of hole-free phase plate imaging and Berriman effect
Evaluation of electron tomography reconstruction methods for interface roughness measurement
No full text
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