492 research outputs found
Antigone e le altre. Figure mitiche al femminile nei saggi di Margarete Susman
No full textIn Margarete Susman’s theoretical and political essays and studies, classical and mythological figures such as Antigone, Pythia, Diotima and Undine become symbols for women’s situation as well as the broader cultural, political and social sphere. The connection between these mythological themes and the intimate, spiritual and intellectual evolution of the author herself signals the originality of her work in women’s studies in general, in women’s literature theory and in mythological studies. This article aims to illustrate the symbolic reading of female mythical figures in Margarete Susman’s writings, also focusing on the connection between mythos and the cultural importance of the maternal function. The icons of the feminine are also objects of Margarete Susman’s writing, addressing questions about the connection of religious attitudes and socio-cultural determined thought
"Jüdin – feminini generis": Margarete Susmans Auseinandersetzung mit Rahel Varnhagen, Dorothea Schlegel und Rosa Luxemburg
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How Phthalocyanines interact with Silicon Substrates: a review of Photoelectron spectroscopy Experiments
No full textXPS analysis on SiO2 sol-gel thin films
No full textThe X-ray Photoelectron Spectroscopy has been applied to study the composition and the electronic structure of thin SiO2 films prepared using the sol-gel technique on silicon substrates. Samples prepared using different amount of tetraethoxysilane and methyltriethoxysilane have been annealed at various temperatures. The valence band, the Si 2p and KL(23)L(23) Auger features have been followed as a function of the preparation conditions. The Si Auger parameter has been used to determine the attendance of different C-H and OH groups. The presence of Si-C bonds, observed in the valence band spectra, strongly decreases as the annealing temperature grows, showing the loss of methyl groups
XPS STUDIES ON SIOX THIN-FILMS
No full textThe surface stoichiometry of SiO(x) thin films (x = 1-2) has been studied by means of X-ray photoelectron spectroscopy. The presence of three Si oxidation states (SiO2, SiO, Si2O3) has been observed through an analysis of the Si2p line shape and the intensity variation of these different silicon oxide signals, as a function of the oxygen content, has been followed. The calculated stoichiometry has been compared with that obtained using the modified Auger parameter method. The good agreement between these results supports the validity of the modified Auger parameter as an easy and fast method to know the surface stoichiometry of SiO(x) films
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