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    Short course FEOL reliability: BTI and TDDB in high k/metal gate, FinFET and Ge-based technologies

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    imec Publications (Interuniversity Microelectronics Centre)

    Gate oxide breakdown in FET devices and circuits (Tutorial)

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    imec Publications (Interuniversity Microelectronics Centre)

    Recent trends in CMOS front-end reliability (tutorial)

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    imec Publications (Interuniversity Microelectronics Centre)

    Advanced experimental techniques for BTI characterization (tutorial)

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    imec Publications (Interuniversity Microelectronics Centre)

    Advanced experimental techniques for BTI characterization (tutorial)

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    imec Publications (Interuniversity Microelectronics Centre)

    Advanced CMOS devices and reliability (tutorial)

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    imec Publications (Interuniversity Microelectronics Centre)

    Evidence that two tightly coupled mechanisms are responsible for negative bias temperature instability in oxynitride MOSFETs

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    imec Publications (Interuniversity Microelectronics Centre)

    Potential vulnerability of dynamic CMOS logic to soft gate oxide breakdown

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    imec Publications (Interuniversity Microelectronics Centre)

    Negative bias temperature instability: recoverable versus permanent degradation

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    imec Publications (Interuniversity Microelectronics Centre)

    Critical modeling issues in negative bias temperature instability

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    imec Publications (Interuniversity Microelectronics Centre)
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