1,721,244 research outputs found
Korea Coastal Debris observation 1
No full text<p>Debris detection using satellite data</p>
<p>Area 1 - Yellow Sea (Incheon, SkySat)</p><p>Created via <a href="https://oceanscan.org">Ocean Scan</a>.<br>Campaign ID: <b>944070e7-a9bd-4f68-8e72-615ba5042054</b>.</p>
An intuitive interaction method for handling intra-articular bone structures in 3D space for fracture surgery planning
No full textPulse I-V characterization of a nanocrystalline oxide device with sub-gap density of states
No full textUnderstanding the charge trapping nature of nano-crystalline oxide semiconductor thin film transistors (TFTs) is one of the most important requirements for their successful application. In our investigation, we employed a fast-pulsed I-V technique for understanding the charge trapping phenomenon and for characterizing the intrinsic device performance of an amorphous/nano-crystalline indium-hafnium-zinc-oxide semiconductor TFT with varying density of states in the bulk. Because of the negligible transient charging effect with a very short pulse, the source-to-drain current obtained with the fast-pulsed I-V measurement was higher than that measured by the direct-current characterization method. This is because the fast-pulsed I-V technique provides a charge-trap free environment, suggesting that it is a representative device characterization methodology of TFTs. In addition, a pulsed source-to-drain current versus time plot was used to quantify the dynamic trapping behavior. We found that the charge trapping phenomenon in amorphous/nano-crystalline indium-hafnium-zinc-oxide TFTs is attributable to the charging/discharging of sub-gap density of states in the bulk and is dictated by multiple trap-to-trap processes.
The influence of interfacial defects on fast charge trapping in nanocrystalline oxide-semiconductor thin film transistors
No full textDefects in oxide semiconductors not only influence the initial device performance but also affect device reliability. The front channel is the major carrier transport region during the transistor turn-on stage, therefore an understanding of defects located in the vicinity of the interface is very important. In this study, we investigated the dynamics of charge transport in a nanocrystalline hafnium-indium-zinc-oxide thin-film transistor (TFT) by short pulse I-V, transient current and 1/f noise measurement methods. We found that the fast charging behavior of the tested device stems from defects located in both the front channel and the interface, following a multi-trapping mechanism. We found that a silicon-nitride stacked hafnium-indium-zinc-oxide TFT is vulnerable to interfacial charge trapping compared with silicon-oxide counterpart, causing significant mobility degradation and threshold voltage instability. The 1/f noise measurement data indicate that the carrier transport in a silicon-nitride stacked TFT device is governed by trapping/de-trapping processes via defects in the interface, while the silicon-oxide device follows the mobility fluctuation model.
Influence of Fast Charging on Accuracy of Mobility in a-InHfZnO Thin-Film Transistor
No full textAmorphous InHfZnO (a-IHZO) thin-film devices have attracted considerable attention owing to their highmobility. However, themobility of a-IHZO thin-film transistors has not been correctly determined, because it is affected by fast charging. In this letter, we investigated the effect of transient charging on the mobility. On the basis of the pulse IDS-VGS method, we present an approach to estimate a correction factor for the measured apparent mobility, which was extracted from pulse amplitude versus threshold voltage shift.
Model-based Kernel Testing for Concurrency Bugs through Counter Example Replay
No full textDespite the growing need for customized operating system kernels for embedded devices, kernel development continues to suffer from high development and testing costs for several reasons, including the high complexity of the kernel code, the infeasibility of unit testing, exponential numbers of concurrent behaviors, and a lack of proper tool support. To alleviate these difficulties, this study proposes the MOdel-basedKERnelTesting (MOKERT) framework, which supports detection of concurrencybugs in the kernel by combining both model checking techniques and testing methods. The MOKERT framework was applied to the file systems of the Linux 2.6 kernel and found a data race bug in the proc file system
Engineered collagen hydrogels for the sustained release of biomolecules and imaging agents: promoting the growth of human gingival cells
No full textWe present here the in vitro release profiles of either fluorescently labeled biomolecules or computed tomography contrast nanoagents from engineered collagen hydrogels under physiological conditions. The collagen constructs were designed as potential biocompatible inserts into wounded human gingiva. The collagen hydrogels were fabricated under a variety of conditions in order to optimize the release profile of biomolecules and nanoparticles for the desired duration and amount. The collagen constructs containing biomolecules/nanoconstructs were incubated under physiological conditions (ie, 37 degrees C and 5% CO2) for 24 hours, and the release profile was tuned from 20% to 70% of initially loaded materials by varying the gelation conditions of the collagen constructs. The amounts of released biomolecules and nanoparticles were quantified respectively by measuring the intensity of fluorescence and X-ray scattering. The collagen hydrogel we fabricated may serve as an efficient platform for the controlled release of biomolecules and imaging agents in human gingiva to facilitate the regeneration of oral tissues.Y
Extending ATAM to Assess Product Line Architecture
No full textSoftware architecture is a core asset for any organization that develops software-intensive systems. Unsuitable architecture can precipitate disaster because the architecture determines the structure of the project. To prevent this, software architecture must be evaluated. The current evaluation methods, however, focus on single product architecture, and not product line architectures and they hardly consider the characteristics of the product lines, such as the variation points. This paper describes the extension of a scenario-based analysis technique for software product architecture-called EATAM, which not only analyzes the variation points of the quality attribute using feature modeling but also creates variability scenarios for the derivation of the variation points using the extended PLUC tag approach. This is a method that aims to consider the tradeoffs in the variability scenarios of the software product family architecture. The method has been validated through a case study involving microwave oven software product line in the appliance domain
Effects of Variable Part Auto Configuration and Management for Software Product Line
No full textLG Electronics Mobile Communications division developed the Variable part Auto Configuration and Management System (VACMS) to improve its current smartphone application development process. However, the effects of the new process using the VACMS have not been assessed yet. In this study, we compare the current process and the new process through a case study. The assessment results show that using the new process the development effort is reduced to 32.5% of that of the current process and the reuse rate becomes 2.34 times higher in Lines of Code
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