1,721,025 research outputs found
Quantitative analysis in XPS: how to measure the peak intensity? The relationship between atomic numebr and the Shirley scattering factor (k) in XP- spectra
No full textUse of the absolute Auger parameter for vanadium in the study of the dielectric relaxation of cerium vanadate
No full textX-ray photoelectron spectroscopy (XPS) is known, mainly, as a technique for surface analysis. It is especially valued for interpretation of the chemical state by means of the chemical shift. This paper concerns the contribution to this shift from polarization of the ligands following core photoionization. Intercalation of ions such as lithium will influence the electronic polarizability of the oxygen ions and hence the value of the Auger parameter (AP). The AP is the difference in kinetic energy of the Auger peak in the spectrum and that of the principal photoelectron peak, calculated by an internationally accepted procedure. Thus, while obtaining the composition and chemical state of a compound one can also determine the polarizability of the material. Polarizability is crucial to the dielectric properties of oxides, such as refractive index, and is of value in optimizing intercalation compounds for use in optoelectronic devices. The use of this methodology will be illustrated using the vanadium ion in V2O5 and CeVO4, including its lithium-intercalated form. Copyright (C) 2002 John Wiley Sons, Ltd
Studies of Vanadium Pentoxide Thin Films as a Function of Number of Lithium Ion Intercalation Cycles
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The intrinsic asymmetry of photoelectron peaks: dependence on chemical state and role in curve fitting
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Distribution of intercalated lithium in V2O5 thin films determined by SIMS depth profiling
No full textThe distribution of Li in the V2O5 films was determined before and after intercalation/deintercalation electrochemical cycles by time of flight secondary ion mass spectroscopy (ToF-SIMS) depth profiling. On deintercalation most of the inserted Li is removed except in the vicinity of the interface with the fluorine-substituted tin oxide, used as a conducting substrate. More surprisingly, Li was also found in the interface region of the part of the film that has not been immersed in the electrolyte and that had thus not been electrochemically controlled. This finding suggests that Li diffuses through the interface, in the plane of the electrode surface, during intercalation of the main body of the film. The SIMS results have been confirmed by proton beam analysis using the nuclear reaction between H and Li to produce characteristic alpha particles that reveal the distribution of Li, both inside and outside the electrochemically treated area of the electrode. The energy loss of the alpha particles on their way through the sample to the detector also reveals the Li concentration distribution inside the V2O5 films. Copyright (C) 2006 John Wiley & Sons, Ltd
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