1,303 research outputs found
Lunar surface exploration.
No full textSpecial issue of the Bendix Technical Journal Volume 4 Number 2 Summer/Autumn 1971 on lunar exploration.ALSEP: The Scientific Voice of the Moon / L. R. Lewis -- Some Aspects of ALSEP Structural/Thermal Design / J. L. McNaughton -- The ALSEP Central Station Data Subsystem / W.M. Tosh -- The Passive Seismic Experiment / D. K. Breseke and J. Lewko, Jr. -- The Active Seismic Experiment / J. R. McDowell -- The Charged-Particle Lunar Environment Experiment / A. D. Robinson and L. D. Ferguson -- The Lunar Heat Flow Experiment / B. D. Smith -- The Laser-Ranging Retroreflector / J. M. Brueger -- ALSEP Human-Engineering Design Criteria / R. L. Redick -- ALSEP Data Management / C. R. Murtaugh, W. K. Stephenson, and B. L. Sharpe -- The Lunar Ejecta and Meteorites Experiment / L. Galan -- The Lunar Mass Spectrometer Experiment / R. D. Ormsby and C. E. DeHaven, Jr. -- The Lunar Seismic Profiling Experiment / J. E. Dye -- The Lunar Surface Gravimeter Experiment / H. K. Hsi and W. E. Crosmer
Sandia/Bendix standard process capability study of printed wiring boards
No full textWith the development of the SL/BX standard process for the manufacture of printed wiring boards, it was determined that a formal capability study should be undertaken. Work on the project began in May 1972. Manufacturing efforts in both production and the Engineering Shop were completed by July 1973. Ten lots of boards (252) were manufactured in the Bendix production department. One lot of boards (24) was manufactured in the Bendix Engineering Shop. Upon completion of inspection by Bendix, all boards were shipped to Sandia Albuquerque for further inspection and testing. Final inspection results of the 276 boards manufactured show the defects to be predominantly of a visual type. A total of 45 defective boards were found, for a 16 percent defective ratio. Of the 16 percent defective boards, 9 percent (26 boards) are considered nonfunctional and would result in scrap. The remaining 7 percent (19 boards) are considered functional but would require deviation. As a result of this study, the conclusion was reached that the Bendix production and Engineering Shop departments have the capability for producing printed wiring boards within the requirements of the SL/BX standard process and related specifications
Bendix Kansas City Division technological spinoff through 1978
No full textThe results of work of Bendix Kansas City Division are made available in the form of technical reports that are processed through the DOE Technical Information Center in Oak Ridge. The present report lists the documents released by the Division, along with author and subject indexes. Drawing sets released are also listed. Locations of report collections in the U.S., other countries, and international agencies are provided. (RWR
Apollo Lunar Surface Experiments Package electronic, electrical and electromechanical composite parts list
No full textThis list of electrical, electronic, and electromechanical (EEE) parts is derived from summary data used by Bendix and Bendix subcontractors in the design and fabrication of flight equipment. While the format varies according to the type of documents used as source material, the essential data to identify the generic type, style, and procurement documents are included.Prepared for NASA-MSC contract NAS9-5829prepared by J. S. Patel ; prepared by Parts and Material Group ALSEP Reliability Department Bendix Aerospace Systems Division.Revision no.
House for J D Gates Esq. 'Bendix' Fixing Detail
No full textThis record was harvested from a previous catalogue system and will be withdrawn in 2025. Information in this record may be superseded or incomplete. Visit this record in UMA's new catalogue at: https://archives.library.unimelb.edu.au/nodes/view/454751YFA Job No. 225. Drawing No. 225/D16320439
Sub-item: [1984.0047.01394] "House for J D Gates Esq. 'Bendix' Fixing Detail
Active Seismic Experiment data format
No full textThis ATM is written in response to Action Item B6-0805-5B requesting Bendix to evaluate the Stanford proposed data format.prepared by J. Zimmer
Dual digital to analog converter reliability prediction and failure mode, effects & criticality analysis
No full textThis ATM documents the Reliability Prediction and Failure Modes Effects & Criticality Analysis of the Bendix designed Dual A/D Converter. The analysis reflects the final flight configuration for the Array D ALSEP System.prepared by Rodney J. Dallaire
Breaking the News? : politische Öffentlichkeit und die Regulierung von Medienintermediären
No full textMaximilian Gahntz, Katja T. J. Neumann, Philipp C. Otte, Bendix J. Sältz, Kathrin Steinbac
Parts application analysis dual 90 channel multiplexer ALSEP Array A-2
No full textThe purpose of this ATM is to document the results of the parts application analysis study conducted on the Dual 90 Channel Multiplexer. This multiplexer represents the Bendix designed unit which utilizes MOS-FET integrated circuits.prepared by Rodney J. Dallaire.Revision no.
Parts application analysis S-Band transmitter
No full textThe purpose of this ATM is to document the Parts Application Analysis (PAA) for the S-Band transmitter designed and manufactured by the Bendix Aerospace Systems Division for use in ALSEP Flight System 2A. The data contained herein defines all transmitter parts less the current, temperature, and RF telemetery.prepared by J. Taylor
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