CORE
CO
nnecting
RE
positories
Services
Services overview
Explore all CORE services
Access to raw data
API
Dataset
FastSync
Content discovery
Recommender
Discovery
OAI identifiers
OAI Resolver
Managing content
Dashboard
Bespoke contracts
Consultancy services
Support us
Support us
Membership
Sponsorship
Research partnership
About
About
About us
Our mission
Team
Blog
FAQs
Contact us
Community governance
Governance
Advisory Board
Board of supporters
Research network
Innovations
Our research
Labs
Filters
1,750 research outputs found
Interview with Karen Bender
Author
Bender Karen
Publication venue
Publication date
05/12/2007
Field of study
No full text
Karen Bender, author of the Washington Post Best Book of the Year award-winning novel Like Normal People and editor of the anthology Choice, discusses her literary career, her writing life, and the path that led her to persue writing
University of North Carolina Wilmington Digital Collections
Application of FIB to support semiconductor process development
Author
Bender Hugo
Publication venue
Publication date
31/12/9999
Field of study
No full text
imec Publications (Interuniversity Microelectronics Centre)
Focused ion beam specimen preparation for transmission electron microscopy studies of ULSI devices
Author
Bender Hugo
Publication venue
Publication date
31/12/9999
Field of study
No full text
imec Publications (Interuniversity Microelectronics Centre)
Application of focused ion beam for failure analysis
Author
Bender Hugo
Publication venue
Publication date
31/12/9999
Field of study
No full text
imec Publications (Interuniversity Microelectronics Centre)
Voltage contrast in the focused ion beam
Author
Bender Hugo
Publication venue
Publication date
01/01/2001
Field of study
No full text
imec Publications (Interuniversity Microelectronics Centre)
Semiconductors and semiconducting devices
Author
Bender Hugo
Publication venue
Publication date
01/01/2012
Field of study
No full text
imec Publications (Interuniversity Microelectronics Centre)
On the applicability of Tougaard background subtraction to general Auger spectra
Author
Bender Hugo
Publication venue
Publication date
01/01/1994
Field of study
No full text
imec Publications (Interuniversity Microelectronics Centre)
Chemical analysis on Focused Ion Beam cross-sections by scanning Auger microscopy
Author
Bender Hugo
Publication venue
Publication date
01/01/2001
Field of study
No full text
imec Publications (Interuniversity Microelectronics Centre)
Application of focused ion beam for failure analysis
Author
Bender Hugo
Publication venue
Publication date
01/01/2000
Field of study
No full text
imec Publications (Interuniversity Microelectronics Centre)
Focused ion beam and transmission electron microscopy for process development
Author
Bender Hugo
Publication venue
Publication date
31/12/9999
Field of study
No full text
imec Publications (Interuniversity Microelectronics Centre)
1
2
3
…
last
No full text
No full text
