1,720,983 research outputs found
Failure mechanisms and analysis of very large scale integrated circuits
No full textThe failure mechanisms affecting advanced Silicon integrated circuits are reviewed
L'affidabilità dei dispositivi a semiconduttore - parte seconda
No full textIn questa seconda parte vengono presentati i fenomeni chimico-fisici che causano i guasti dei componenti elettronici
La fisica dei meccanismi di guasto nella microelettronica
No full textThis paper is a tutorial on failure mechanisms and reliability physics of Si semiconductor devices and circuit
L'affidabilità dei dispositivi a semiconduttore
No full textThe paper is a tutorial on the basic concepts of semiconductor device reliability, with particular emphasis on accelerated testing procedures, definition of reliability, calculation of failure rates etc
L'affidabilità dei dispositivi a semiconduttore - parte prima
No full textIn questo articolo, dopo aver definito l'affidabilità come disciplina e come proprietà degli oggetti, vengono introdotte le funzioni statistiche più usate per l'analisi dei dati e la misura dell'affidabilità
Updating of CMOS reliability
No full textUpdated results of massive life tests on CMOS are reported. The failure rate derived from laboratory conditions is extrapolated for long life use and compared with field results. Failure mechanism distribution is also reported
CONDUCTIVE FIBER MATERIALS
No full textThe present invention relates to a fiber material, in particular a textile which is conductive. The fiber material includes a base textile material on the surface of which a plurality of nanoparticles are deposited and a conductive polymer layer on top of the nanoparticles
Il circolo dell'affidabilità sui componenti elettronici
No full textThe paper describes the activities of an alliance between Italian companies and government laboratories, aimed at sharing data, procedures and at promoting actions concerning the reliability of integrated circuits and electronic component
Reliability evaluation of plastic packaged devices for long life applications by THB test
No full textThe reliability of transistors, bipolar and CMOS integrated circuits encapsulated in different types of plastic packages was investigated by using the 85°C/85%R.H. test with applied bias and thr results compared with a long term operating life test
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