1,721,078 research outputs found
Active load or source impedance synthesis for measurement test set of microwave components and systems
No full textAn active load or source impedance synthesis apparatus for experimental characterization of electronic components (E) working in the range from 500 MHz to 110 GHz, includes an active loop with at least one amplifier (Am), one magnitude and phase control system (Ra, Rs, one directional coupler (Acc) and a measurement system connected to a device under test (E), where the directional coupler (Acc) is connected after the most significant losses of the measurement syste
Generalized mixed-mode S-parameters
Full text linkThis paper presents an innovative approach to extend the S-parameter definition to multiport networks having conventional single-ended and differential ports, as is the case for operational amplifiers, transformers and baluns. To give maximum generality to this technique, for example, allowing for complex -parameter reference impedances, the mathematical derivation will be carried out with the most general definition of the -parameters. The presented approach gives the same results already published for circuits with differential ports only when the required simplifications are applied
VALUTAZIONE E RIDUZIONE DELLE INCERTEZZE RESIDUE DI TARATURA PER BANCHI DI LOAD-PULL ALLE ONDE MILLIMETRICHE
No full textIn questa memoria viene presentato un metodo per la valutazione delle incertezze residue di taratura di
sistemi di load-pull a microonde. Si riporta qui per la prima volta un confronto completo tra sistemi
di tipo real-time e non-real-time alle onde millimetriche. Per la valutazione delle incertezze, vengono
prese in considerazione e confrontate due cifre di merito. Si mostrano quindi le differenze ottenute
usando le due diverse metodologie per la valutazione di incertezze, chiarendo in quali casi è opportuno
usare l’una o l’altra. Per quanto riguarda i sistemi non-real-time, grazie ad un simulatore messo a punto
per lo scopo, vengono forniti i valori tipici di incertezza di tali sistemi alle onde millimetriche. Infine
viene proposta una nuova metodologia per ridurre le incertezze residue di taratura nei sistemi nonreal-
time. Tale tecnica è basata sull’ottimizzazione delle misure di un dispositivo thru. Come verifica,
vengono mostrati gli effetti di tale ottimizzazione su misure reali di un transistore, effettuate a 40 GHz
Harmonic Load-Pull Techniques: An Overview of Modern Systems
No full textThe characterization of microwave devices under nonlinear conditions is fundamental for device technology development, to improve device large signal model accuracy and reliability, as well as an essential tool to support the design of power amplifiers (PAs). Since the input and output device terminations at fundamental and harmonics frequencies play a crucial role to set the device behaviors and performances, load-pull (LP) measurements are today one of the prominent characterization solutions at RF, micro-, and millimeter waves. In this article, a concise but comprehensive overview of the most important LP techniques available today is presented and pros and cons of the several approaches are highlighted and discusse
A Comparison of Uncertainty Evaluation Methods for On-Wafer S-Parameter Measurements
Full text linkAn experimental analysis of on-wafer S-parameter uncertainties is presented. Recently, two different approaches, based either on differential numerical programming or on a fully analytical solution have been introduced. In order estabilish their suitability, a careful comparison is here given for on-wafer meaurements. Through this comparison, possible limitations and causes of errors are also highlighted. Finally, the uncertainty evaluation of the 16-term error model is here presented for the first tim
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