1,721,268 research outputs found
Recent developments in the broadband near-field Scanning Microwave Microscopy (SMM)
No full textWorkshop internazionale (su invito) all'interno del European Microwave Conference 2010, in Parigi (Francia
EM Simulator Models Acoustic/Electric Designs
No full textThis powerful tool combines elements of acoustical, mechanical, and electrical design with an intuitive interface and ease of use in modeling a wide range of high-frequency structures
Hybrid Electromagnetic/Acoustic Analysis of TFBAR devices and circuits
No full textWorkshop internazionale (su invito), Montreux, Switzerlan
Modello Elettromagnetico di AlGaAs-InGaAs pHEMT per Frequenze Millimetriche
No full textAtti XIII RiNEm, Com
Using Evanescent Microwave Fields for Nanoscale Imaging
No full textWorkshop (su invito) all'interno dello European Microwave Conference (EuMW 2009) in Roma (28 settembre, 2 ottobre
Comments on “On Deembedding of Port Discontinuities in Full-Wave CAD Models of Multiport Circuits” and related comments.
No full textAn EM Simulator for MEMS and Real Life MMICs
No full textIntroduction to a low cost software package used to address the 3D EM analysis of structures involving complex substrates as encountered in common MMIC desig
Modello Dinamico per la Caratterizzazione delle Discontinuità dei Conduttori in Guide Planari Reali per MMIC
No full textAtti XII RiNEm, Cetrar
High Resolution Imaging at nanoscale by Scanning Probe Microscopy
No full textIn this talk we will review the principles of the Scanning Probe Microscopy techniques used by our group, detailing the working principles of some techniques introduced by ourselves and describing recent results. In particular we will describe and discuss a broad-band Near Field Scanning Microwave Microscopy approach, along with its use in time-domain, and an infrared interferometric technique enabling tomographic mapping of samples
Scanning Probe Microscopy for Nanotechnology: from Microwaves to Infrared imaging
No full textScanning Probe Microscopy relies on the use of short-range interactions
between a probe and a sample, the probe being raster scanned near the surface
of a sample (or vice-versa). The nature of the interaction defines the type of
microscope. Aim of this presentation is to introduce the latest developments on
two completely different approaches exploiting electromagnetic waves. The first
one exploits the near-field in the microwave and millimetre wave range, while
the second one makes use of an optical Fabry-Perot microcavity to achieve a
lens-free infrared tomography. While the near field microwave microscope
allows to achieve nanometric resolution, the infrared imaging directly produces
tomographic information, and both are minimally or non-invasive
- …
