1,721,003 research outputs found
Wide-Bandwidth Contactless Testing of Signals in ULSI Circuits by means of Ultrafast Photon-Detectors
No full textWe characterized the emission intensity of n and p MOSFET’s with different channel lengths, as a function of the biasing conditions. We investigated the physics underlying the luminescence, developed an analytical model and elaborated a complementary part for SPICE, in order to simulate in the circuit analysis also the optical pulses emitted from MOSFET’s. By comparing the simulated and measured optical waveforms, it is possible to identify failures and fix errors in schematics and layouts. We carried out measurements on fast ring oscillators, that made possible to evaluated the phase noise and other electrical characteristics
Method and apparatus for creating time-resolved emission images of integrated circuits using a single-point single-photon detector and a scanning system
No full textA Scanning Time-Resolved Emission (S-TRE) microscope or system includes an optical system configured to collect light from emissions of light generated by a device under test (DUT). A scanning system is configured to permit the emissions of light to be collected from positions across the DUT in accordance with a scan pattern. A timing photodetector is configured to detect a single photon or photons of the emissions of light from the particular positions across the DUT such that the emissions of light are correlated to the positions to create a time-dependent map of the emissions of light across the DUT
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