1,721,125 research outputs found
La pila di Volta: un successo della scienza italiana durato duecento anni
No full texthttp://ulisse.sissa.it/biblioteca/saggio/2002/Ubib021101s00
A Comparison of the Electrochromic Behavior and the Mechanical Properties of WO[sub 3] and NiO[sub x] Thin Film Electrodes
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The Suppression of GaAs Photocorrosion in Aqueous Solutions by Sulfonated Anthraquinones
No full textA new simple method to heal defects and to improve electrode passivity of aromatic SAMs on gold
No full textIn the present work we report a new, simple method to heal the defects of SAMs constituted by small aromatic thiols, namely benzenethiol (BT) and 2-naphthalenethiol (2-NT), on polycrystalline Au surfaces. The method consists in the alternate immersion of the Au substrate in the thiolic solution and in ultrapure water. The layers obtained with the new protocol were characterized by means of Cyclic Voltammetry (CV) and Electrochemical Impedance Spectroscopy (EIS), and were compared with SAMs prepared with the traditional adsorption procedure. The results show that our treatment leads to a remarkable increase of the blocking behavior of the layers, indicating a decrease in density of defective sites, and to an improvement of the SAM stability. On the basis of the obtained results, a possible explanation to this phenomenon is proposed. (C) 2013 Elsevier B.V. All rights reserved
Aging of optical and mechanical properties of MxWO3 with proton and lithium ions
No full textThe aging of electrochromic tungsten trioxide (WO3) film electrodes has been related to the retention of ion charge and measured by means of spectral transmittance, mechanical stress and potentiometry. The drop of the optical contrast and the continuous increase of thin film stress during charge-discharge cycles has been attributed to a phase transition from the original WO3 to a mixed conduction material resulting more compact and with higher rigidity
Non-invasive in-situ techniques fof the characterization of processes at thin film electrodes
No full textIn this contribution we report on the application of the Bending Beam Method (BBM) and the Probe Deflection Beam (PDB) as non destructive tools for the in-situ characterization of electrode materials and electrochemical processes. The systems under investigation usually possess a thin film configuration with thickness values ranging between 0.1 and 100 um. the detection of the probing laser beam displacement can be then exploited for the evaluation of the mechanical stress in thin film electrodes with BBM, or for the identification of the actual species flowing to/from the electrode with PBD technique. The PBD and BBM characterization of some electrochemical processes will be here presented
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