1,721,205 research outputs found
The dependence of fingerprints relevant to PDs on degradation time and test voltageProceedings of Conference on Electrical Insulation and Dielectric Phenomena - CEIDP '96
No full text
The effects of temperature on the tree growth phenomena and relevant PDProceedings of 1995 Conference on Electrical Insulation and Dielectric Phenomena
No full textWater absorption effects on prebreakdown phenomena under divergent electrical field conditionsProceedings of 1995 Conference on Electrical Insulation and Dielectric Phenomena
No full textThe influence of digital measurement system characteristics on PD patternsProceedings of 1995 Conference on Electrical Insulation and Dielectric Phenomena
No full textEffect of accidental beam losses on the ATLAS pixel detector
No full textThe ATLAS pixel detector has been designed to sustain a dose of 500 kGy integrated over 10 years of operation. This very substantial radiation hardness should also favor the survival of the detector in case of accidental beam losses. The effect of a very intensive beam releasing a high instantaneous dose in the pixel detector has been measured in a short expt. performed at the CERN Proton Synchrotron. The results confirm that the ATLAS pixel detector can survive to beam losses with minimal or no deterioration of performance
Localisation of partial discharge sites on power generator bars by means of ultrasonic measurementsIEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings
No full textNon-conventional characterisation of MV measurement transformers solid insulation systems through analyses of digitally acquired PD patternsIEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena
No full textInvestigation of aging rate in polymer films subjected to surface discharges under distorted voltageIEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena
No full textMeasuring the degradation level of polymer films subjected to partial dischargesConference Record of the 1996 IEEE International Symposium on Electrical Insulation
No full text- …
