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Electron energy distributions in silicon structures at low applied voltages and high electric fields
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Optimal Non-parametric Estimation of 1/f Noise Spectrum in Semiconductor Device
No full textIn this paper, we discuss the optimal nonparametric estimation of 1/f noise in MOSFET devices. We adopt a simple experimental procedure to evaluate the performance of different methods for the spectrum estimation. In particular, we analyze the variance of the spectrum in the case of averaged periodograms, according to Bartlett and Welch methods. The influence of the adopted window function and of the overlap between segments is investigated. Finally, an optimal power spectrum estimation is identified, allowing to minimize the dispersion of the spectrum
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