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    1,721,706 research outputs found

    Application of FIB to support semiconductor process development

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    imec Publications (Interuniversity Microelectronics Centre)

    Focused ion beam specimen preparation for transmission electron microscopy studies of ULSI devices

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    imec Publications (Interuniversity Microelectronics Centre)

    Application of focused ion beam for failure analysis

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    imec Publications (Interuniversity Microelectronics Centre)

    Voltage contrast in the focused ion beam

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    imec Publications (Interuniversity Microelectronics Centre)

    Semiconductors and semiconducting devices

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    imec Publications (Interuniversity Microelectronics Centre)

    On the applicability of Tougaard background subtraction to general Auger spectra

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    imec Publications (Interuniversity Microelectronics Centre)

    Chemical analysis on Focused Ion Beam cross-sections by scanning Auger microscopy

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    imec Publications (Interuniversity Microelectronics Centre)

    Application of focused ion beam for failure analysis

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    imec Publications (Interuniversity Microelectronics Centre)

    Focused ion beam and transmission electron microscopy for process development

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    imec Publications (Interuniversity Microelectronics Centre)

    Structural characterization of nano-sized materials

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    imec Publications (Interuniversity Microelectronics Centre)
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