1,721,134 research outputs found
Comments on treatment of EXAFS data taken in the fluorescence mode in non-linear conditions by G. Ciatto et al. (2004). J. Synchrotron Rad. 11, 278-283
No full textThe author of the comment rightly suggests the improvement of
our data-correction method II by taking into account the dead time of
the fast channel of the digital electronics. In our paper, we preferred
to neglect the dead time of the fast channel since we did not have a
reliable measurement of it, but could only estimate it from the
trapezoidal filter length. If we compare the nominal value of the slow
channel dead time reported in the XIA manual (about 8.2 ms) and the
one we have measured from the data (9.1 ms) we find an evident
disagreement; thus, we were not completely confident in using the
estimated value of 0.8 ms for the fast channel dead time...
Powder diffraction and synchrotron radiation.
No full textPowder diffraction is one of the fundamental techniques for the investigation of materials. Its sensitivity to long range order makes it ideal for the identification, quantification and structural characterization of crystalline phases. Powder diffraction experiments performed at synchrotron sources make ample use of the intrinsic characteristics of synchrotron radiation in terms of energy tunability, brilliance, natural divergence, and excellent signal/noise ratio. Synchrotron radiation powder diffraction (SR-PD) enhances and optimizes the traditional applications of laboratory XRPD, such as phase identification, phase quantification, texture analysis, and peak broadening analysis in terms of stress/strain. However, the properties of the synchrotron X-rays also allow a number of experiments not accessible with laboratory sources, especially in terms of time-resolution, the use of non-ambient sample environments, and simultaneous and combined experiments. The mapping of the physical, chemical, and crystallographic properties of the sample in 2D and 3D using smart combinations of diffraction imaging spectroscopy is the natural current evolution of many synchrotron instruments, and one that is bound to have a great
impact on many aspects of materials studies
Evidence for relaxed and high-quality growth of GaN on SiC(0001) (vol 74, pg 3308, 1999)
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Tetragonal-strain-induced local structural modifications in InAsxP1-x/InP superlatttices: A detailed x-ray-absorption investigation
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STRUCTURE OF A-SI1-XCX-H ALLOYS BY WIDE-ANGLE X-RAY-SCATTERING - DETAILED DETERMINATION OF FIRST-SHELL AND 2ND-SHELL ENVIRONMENT FOR SI AND C ATOMS
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