1,721,315 research outputs found
ECAPD9 - 9th European Conference on Application of Polar Dielectrics
No full textThe 9th European Conference on Applications of Polar Dielectrics (ECAPD) will be held in Roma, Italy, from tuesday
August 26th to friday August 29th 2008.
ECAPD is the principal european and international forum where the latest research and technological advances in the
field of polar dielectric materials are being presented and discussed.
The conference is the ninth in a series that started in Zürich (Switzerland) in 1988 and was followed by the editions in
London (UK) in 1992, Bled (Slovenia) in 1996, Montreux (Switzerland) in 1998, Jurmala (Latvia) in 2000, Aveiro
(Portugal) in 2002, Liberec (Czech Republic) in 2004, and Metz (France) in 2006.
The objective of ECAPD’9 is to achieve international and interdisciplinary exchange of information and cooperation
among researchers in academia, government laboratories, and industries, and to stimulate growth in the field of polar
dielectric materials and applications.
Conference Chairs
Prof. F.Michelotti, Energetics Department, SAPIENZA University, Rome
Prof. M.Bertolotti, Energetics Department, SAPIENZA University, Rome
ECAPD’9 Conference Secretariat
Dr. Alessandro Belardini, Energetics Department, SAPIENZA University, Rome
Dr.Lorenzo Dominici, Energetics Department, SAPIENZA University, Rome
Dr. Maria Cristina Larciprete, Energetics Department, SAPIENZA University, Rom
Wide band negative magnetic permeability materials (NMPM) with composite metalsemiconductor structures based on the Drude model, and applications to negative-refractive index (NIM)
No full text
Asymmetric transmission of some two-dimensional photonic crystals
No full textSome particular geometries are discussed in which the transmission spectrum is different for light traveling from right to left or from left to right. The conditions that allow this transmission asymmetry are discussed. (c) 2007 Optical Society of America
Photothermal depth profiling by thermal wave backscattering and genetic algorithms
No full textPhotothermal depth profiling is usually applied to inhomogeneous materials to localize the optical inhomogeneity or retrieve the thermal effusivity depth profile by simply monitoring the photothermal signal after the pump beam excitation. In this paper the different kinds of inverse problems related to photothermal depth profiling are discussed, and the solutions given by thermal wave backscattering (TWBS) and genetic algorithms (GAs) are compared. Finally, the different performances and limits of validity on known linear profiles are compared
Engineering of Z-Scan experimental configuration for fast characterization of nonlinear materials
No full text
Special Issue on Materials for Nonlinear Optics
No full textNumero Speciale del giornale Pure and Applied Optics contenente gli Atti del Congresso della Società Europea di Ottica Materials for Nonlinear Optic
- …
