354 research outputs found
Controlling Festo MPS Station With Beckhoff Industrial Controller
No full textThis thesis is about controlling a Festo Modular Production System (Festo MPS) station with Beckhoff industrial controller, a Beckhoff Programmable Logic Controller (PLC). This thesis aims to create a simulation of industrial automation environment with Festo MPS station, by controlling this station to sort workpieces by using sensors and actuators according to the colour and the type of material of the workpieces.Mechatronics Engineering BSc.BSc/B
GIXRF In The Soft X-Ray Range Used For The Characterization Of Ultra Shallow Junctions
No full textGrazing Incidence X-Ray Fluorescence (GIXRF) analysis in the soft X-ray range provides excellent conditions for exciting B-K and As-Liii,ii shells. The X-ray Standing Wave field (XSW) associated with GIXRF on flat samples is used as a tunable sensor to gain information about the implantation profile in the nm range due to the in-depth changes of the XSW intensity dependent on the angle between the sample surface and the primary beam. This technique is very sensitive to near surface layers. It is therefore well suited for the study of ultra shallow dopant distributions. Arsenic implanted (100) Si wafers with nominal fluence between 1.0E14 cm−2 and 5.0E15 cm−2 and implantation energies between 0.5 keV and 5.0 keV and Boron implanted (100) Si wafers with nominal fluence of 1.0E14 cm−2 and 5.0E15 cm−2 and implantation energies between 0.2 keV and 3.0 keV have been used to compare SIMS analysis with synchrotron radiation induced GIXRF analysis in the soft X-ray range. The measurements have been carried out at the laboratory of the Physikalisch-Technische Bundesanstalt at the electron storage ring BESSY II using monochromatized undulator radiation of well-known radiant power and spectral purity. Here the use of an absolutely calibrated energy-dispersive detector for the registration of the B-K and As-L fluorescence radiation allows for the absolute determination of the total retained dose. An estimate of the concentration profile has been obtained by fitting the X-ray fluorescence angular scans with profiles derived by simulation of the implantation process. A good match among the total retained dose measured with the different techniques has been observed
Ultra low energy Boron ion implants in silicon analyzed by not-oxydizing O2+ bombardment and synchrotron radiation grazing incidence x-ray fluorescence
No full textFormer results on B ultra shallow junction (USJ) characterization by SIMS revealed that collecting B+ positive ions under oxidizing
conditions, like normal O2+ ion bombardment or oblique incidence O2+ beam with 'oxygen flooding', is effective in terms of detection limit, dosimetry accuracy and depth resolution. However, the profile shape at the surface and/or at the native SiO2/ Si interface is strongly influenced by artefacts resulting in a B peak at the surface. In recent years, a not-oxidizing approach (analysis in vacuum under oblique incidence beam), once corrected for the variation of ion yield, resulted more accurate in revealing the profile shape at surface and at the (native) SiO2/ Si interface. The drawback of the approach is the rapid roughness formation on the SIMS crater bottom with a consequent rapid variation of sputtering yield. In this work a not-oxidizing approach (either a 0.5 or 0.3 keV impact energy O2+ beam with ~70° incidence) is improved by rotating the sample during sputtering to reduce the roughness formation and applied to characterize ultra low energy B implants in Si. 11B implants in (100) silicon with implant energy between 0.2 and 3.0 keV
and implanted dose between 1E14 and 5E15 cm-2 were analyzed. A uniformly B doped Si sample was analyzed varying O2 leak pressure in order to identify the species more sensitive to the actual state of oxidation and the relation of the sensitivity factors with the degree of oxidation. Atomic force microscopy was applied to investigate the development of roughness on the SIMS crater. The resulting quantified B profiles were cross-checked with results of (soft x-ray) synchrotron radiation grazing incidence x-ray fluorescence (SR-GIXRF) obtained at the radiometry laboratory of the Physikalisch-Technische Bundesanstalt at Bessy II within the EC financed ANNA project (contract n. 026134(RII3))
Knowledge of Breast Cancer Patients to so-called Cancer Diets to begin a Medical Rehabilitation
No full textExner AK, Kähnert H, Leibbrand B, Berg-Beckhoff G. Kenntnisstand von Brustkrebspatientinnen zu sog. Krebsdiäten zu Beginn einer medizinischen Rehabilitation. Ernährungs-Umschau. 2014;61(7):112-115
Stability of risk perception related to mobile phone stations over two years on the individual level. The QUEBEB study
No full textBerg-Beckhoff G, Kowall B, Breckenkamp J, Schlehofer B, Schüz J, Blettner M. Stability of risk perception related to mobile phone base stations over two years on the individual level. The QUEBEB study. Presented at the 56. GMDS-Jahrestagung und 6. DGEpi-Jahrestagung, Mainz
Determinants and stability over time of perception of health risks related to mobile phone base stations
No full textKowall B, Breckenkamp J, Blettner M, Schlehofer B, Schüz J, Berg-Beckhoff G. Determinants and stability over time of perception of health risks related to mobile phone base stations. International Journal of Public Health. 2011;57(4):735-743
Knowledge and risk perception about electromagnetic fields in general practitioners in Germany
No full textBerg-Beckhoff G, Kowall B, Breckenkamp J, Leppin A. Knowledge and risk perception about electromagnetic fields in general practitioners in Germany. European Journal of Public Health. 2011;21(Suppl_1):260
Radio frequency electromagnetic fields: Health effects
No full textBerg-Beckhoff G, Kowall B, Breckenkamp J. Radio frequency electromagnetic fields: Health effects. In: Nriagu J, ed. Encyclopedia of Environmental Health. Vol Volume 4. Burlington: Wiley; 2011: 721-727
Special Issue: The Eleventh International Topical Meeting on Industrial Radiation and Radioisotope Measurement Applications (IRRMA-11) Bologna, 23-28 July 2023
No full textEditorial to the Proceedings of the Eleventh International Topical Meeting on Industrial Radiation and Radioisotope Measurement Applications (IRRMA-11) Bologna, 23-28 July 2023
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