2 research outputs found
K. Satoh
No full textEffect of Prestrain at Elevated Introduction It is well known that embrittlement due to thermal strain cycling during welding occasionally results in a significant decrease in fracture strength of welded joints. Because of considerable practical importance, a large number of studies on hot strain embrittlement have been carried out from a mechanical and metallurgical point of view Wells In the present study, as the first step to clarify these combined effects, the influences of hot strain embrittlement on fracture mechanisms are investigated in detail. Fracture processes of specimens prestrained at elevated temperature, which are dynamically-strain-aged similar to welded specimens, 1 and those of strain-aged specimens are observe
Reliable state retention-based embedded processors through monitoring and recovery
No full textState retention power gating and voltage-scaled state retention are two effective design techniques, commonly employed in embedded processors, for reducing idle circuit leakage power. This paper presents a methodology for improving the reliability of embedded processors in the presence of power supply noise and soft errors. A key feature of the method is low cost, which is achieved through reuse of the scan chain for state monitoring, and it is effective because it can correct single and multiple bit errors through hardware and software respectively. To validate the methodology, ARM Cortex-M0 embedded microprocessor (provided by our industrial project partner) is implemented in FPGA and further synthesized using 65-nm technology to quantify the cost in terms of area, latency and energy. It is shown that the proposed methodology has a small area overhead (8.6%) with less than 4% worst-case increase in critical path and is capable of detecting and correcting both single bit and multi bit errors for a wide range of fault rates
