1,720,964 research outputs found
Magnetic loss separation under alternating, elliptical and circular flux in non-oriented Fe-Si laminations
No full textConduction mechanism and flicker noise in zinc oxide varistors
No full textJournal of Applied Physics (1), - Measurements were performed on the power spectral density Sv of the flicker noise in ZnO varistors as a function of temperature (from 110 to 370 K), bias voltage (from 10 to 90% of the varistor voltage), and frequency (from 0.1 Hz to 2 kHz). Capacitance-voltage (C-V) curves and current-voltage (I-V) characteristics as a function of temperature were also measured. The picture resulting from these measurements is very self-consistent when the data are interpreted on the basis of a Schottky emission model and flicker island models. In particular, the temperature and frequency dependences of Sv provide direct experimental evidence of the thermally activated emission of electrons from localized states, distributed over a large spectrum of energy levels, at the ZnO grain boundaries. Both I-V, C-V curves and Sv data enable one to obtain reliable information on the intergranular barrier height, its dependence on temperature and bias voltag
The energy loss components under alternating, elliptical and circular flux in non-oriented alloys
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Excess noise and its temperature dependence in thick-film (cermet) resistors
No full textMeasurements have been made of the current noise in thick-film resistors (TFR) based on Ru-pyrochlore conductive grains, with sheet resistivities covering a range of four decades. The temperature dependence of the exponent (alfa) in 1/f noise spectra and the relative integral noise was investigated in the temperature range from 77 to 650 K. It shown that the presence of a minimum in the realtive voltage noise fluctuations os a general phenomenon, as is the increase in (alfa) with increasing temperature. Tevetheless these two effects seem not be mutually correlated. The possibility of developing interpretative model for noise phenomenon in TFR is discussed
Comprehensive Model of Magnetization Curve, Hysteresis Loops, and Losses in Any Direction in Grain-Oriented Fe-Si
No full textMeasuring and predicting hysteresis loops and losses in any direction in GO Fe-Si laminations
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